SimulTOF Technology

Our initial product offerings incorporate proprietary features covered by eight issued and six pending patents. Particularly important is the invention of a new method and apparatus for focusing ions in a time-of-flight mass spectrometer that provides, for the first time, capability for focusing ions in time with simultaneous correction of errors from both initial velocity spread and uncertainty in initial position. This invention (the basis for our SimulTOF Systems name) provides substantially superior instrument performance compared to the prior art that employs the technique known as delayed extraction. This new SimulTOF technology renders all earlier time-of-flight analyzers obsolete.